Polytec Technical Presentation: Dynamic Characterization of MEMS using Laser Vibrometry
When: Tuesday November 27th, 10 AM
Where: Room 218 Spilker Engineering and Applied Science Building (formerly nano)
Polytec presents technology for dynamic characterization of MEMS. Our
Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of MEMS. The MSA-500 features laser vibrometry for measurement of out-of-plane motion with resolution down to picometers and bandwidth out to MHz. Scanning measurements provide full-field mapping and 3D visualization of deflection shapes. The system also includes Strobe Video Microscopy for planar motion and White Light Interferometer for static topography measurements. Our latest capabilities include our Ultra High Frequency (UHF-120) Vibrometer featuring 1.2 GHz frequency bandwidth.
This technology is used throughout the MEMS research community. We present several characterization studies where our MSA has been instrumental in research and development of MEMS.
Our engineers will present new advances in our measurement technology and discuss potential MEMS applications you may have.
More information at: http://www.polytec.com/int/applications/micro-nano-technology/
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